Atomic force microscope (AFM) is a specialized instrument used for imaging and measuring surface structures and properties with a high level of resolution. It works by scanning the surface of a sample with a very fine probe that interacts with the surface on an atomic level, creating a 3D image of the sample's surface. AFM is commonly used in materials science, biology, and nanotechnology research to study a wide range of materials and structures. However, it requires specialized training to operate and interpret the data obtained from AFM imaging.