Unique Skill ID: KS123G572N76KBTR0F1R
Ellipsometry
Ellipsometry is an analytical tool used to measure the properties of thin films and surfaces. It measures changes in the polarization of light reflected from a surface, allowing researchers to determine characteristics such as thickness, refractive index, and surface roughness. It is commonly used in materials science, chemistry, and physics research. However, it requires specialized training and knowledge to properly use and interpret the data obtained from ellipsometry measurements.
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