Atom Probe Field Ion Microscopy
Atom Probe Field Ion Microscopy (APFIM) is a specialized technique used in materials science to study the atomic and chemical structure of materials at a nanometer scale. This technique involves using an extremely sharp needle to extract individual atoms from the surface of a material and then analyzing them using an electric and magnetic field. This specialized skill requires extensive training and expertise in materials science, vacuum technology, and instrument design and operation. It is commonly used in industries such as semiconductors, metallurgy, and nanotechnology.
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